Definicija: A technology that allows engineers to perform extensive debugging and diagnostics on a system through a small number of dedicated test pins. Signals are scanned into and out of the I/O cells of a device serially to control its inputs and test the outputs under various conditions.
Definicija: A technology that allows engineers to perform extensive debugging and diagnostics on a system through a small number of dedicated test pins. Signals are scanned into and out of the I/O cells of a device serially to control its inputs and test the outputs under various conditions.
Definicija: A technology that allows engineers to perform extensive debugging and diagnostics on a system through a small number of dedicated test pins. Signals are scanned into and out of the I/O cells of a device serially to control its inputs and test the outputs under various conditions.